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XYZ Invertred Scanning Stages with Piezo Z Axis

The scanning stages of the PZ series not only offer the high-precision XY positioning but also additional ultra-fast piezo Z-axis nanometre adjustment.

The vertical movement of the specimen instead of the movement of a single lens allows all lenses to be used. The piezo top plate has a standard opening of 160 x 110 mm and can accommodate a variety of specimen holders for various applications.

 

The PZ-2000 XYZ stage has been specifically designed to provide a high resolution, and highly repeatable, means of controlling the X, Y, and Z position of the microscope stage.

The ultra flat PZ-2000FT XYZ stage has been specifically designed to provide a high resolution, and highly repeatable, means of controlling the X, Y, and Z position of the microscope stage.

The US-2000 Flat Top XYZ stage has been specifically designed to provide an ultra-stable, high resolution, and highly repeatable means of controlling the X, Y position of the microscope stage for superior resolution microscopy applications

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